A. SEFAOĞLU Et Al. , "The effects of the temperature and annealing on current-voltage characteristics of Ni/n-type 6H-SiC Schottky diode," MICROELECTRONIC ENGINEERING , vol.85, no.3, pp.631-635, 2008
SEFAOĞLU, A. Et Al. 2008. The effects of the temperature and annealing on current-voltage characteristics of Ni/n-type 6H-SiC Schottky diode. MICROELECTRONIC ENGINEERING , vol.85, no.3 , 631-635.
SEFAOĞLU, A., Duman, S., DOĞAN, S., Guerbulak, B., Tuezemen, S., & Tueruet, A., (2008). The effects of the temperature and annealing on current-voltage characteristics of Ni/n-type 6H-SiC Schottky diode. MICROELECTRONIC ENGINEERING , vol.85, no.3, 631-635.
SEFAOĞLU, A Et Al. "The effects of the temperature and annealing on current-voltage characteristics of Ni/n-type 6H-SiC Schottky diode," MICROELECTRONIC ENGINEERING , vol.85, no.3, 631-635, 2008
SEFAOĞLU, A Et Al. "The effects of the temperature and annealing on current-voltage characteristics of Ni/n-type 6H-SiC Schottky diode." MICROELECTRONIC ENGINEERING , vol.85, no.3, pp.631-635, 2008
SEFAOĞLU, A. Et Al. (2008) . "The effects of the temperature and annealing on current-voltage characteristics of Ni/n-type 6H-SiC Schottky diode." MICROELECTRONIC ENGINEERING , vol.85, no.3, pp.631-635.
@article{article, author={A SEFAOĞLU Et Al. }, title={The effects of the temperature and annealing on current-voltage characteristics of Ni/n-type 6H-SiC Schottky diode}, journal={MICROELECTRONIC ENGINEERING}, year=2008, pages={631-635} }