Determination of Effect of X-ray Tube Emission Current (IE) on Intensities of X-rays for Two Different Sample Preparation Method Using Correction Factor in WDXRF Spectrometer

Demir F., Budak G., KARABULUT A.

INSTRUMENTATION SCIENCE & TECHNOLOGY, cilt.37, sa.4, ss.437-445, 2009 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 37 Sayı: 4
  • Basım Tarihi: 2009
  • Doi Numarası: 10.1080/10739140903087816
  • Dergi Adı: INSTRUMENTATION SCIENCE & TECHNOLOGY
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.437-445
  • Atatürk Üniversitesi Adresli: Evet

Özet

In this study, the effect of X-ray tube emission current of intensities of K X-rays of all elements from KBr samples. The samples from potassium bromide (99.9%) have been prepared by using two different sample preparation techniques; powder on mylar film and pulverization. All elements in these samples have been measured at six different X-ray tube emission current values by using WDXRF spectrometer. A linear relationship was found between intensity and X-ray tube emission current, but according to different samples preparation techniques slopes of these regression curves are different. In the all elements, the intensities of K X-rays from powder sample on mylar film convert into the intensities of K X-rays from the samples with a correction factor. Therefore, the analysis results from powder sample on mylar film are modified.