Improved Method for Permittivity Determination of Dielectric Samples by Free-Space Measurements

HASAR U. C., KAYA Y., Ozturk H., Izginli M., ERTUĞRUL M., Barroso J. J., ...Daha Fazla

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, cilt.71, 2022 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 71
  • Basım Tarihi: 2022
  • Doi Numarası: 10.1109/tim.2022.3153991
  • Dergi Adı: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, Aerospace Database, Applied Science & Technology Source, Business Source Elite, Business Source Premier, Communication Abstracts, Compendex, Computer & Applied Sciences, INSPEC, Metadex, Civil Engineering Abstracts
  • Anahtar Kelimeler: Complex permittivity, deembedding technique, free-space, gating, uncalibrated measurements, CALIBRATION-INDEPENDENT METHOD, COMPLEX PERMITTIVITY, REFLECTION, RETRIEVAL, CONSTANT, RECONSTRUCTION, PARAMETERS, THICKNESS
  • Atatürk Üniversitesi Adresli: Evet

Özet

A new deembedding technique is proposed for relative complex permittivity epsilon(r) determination of dielectric materials using gated free-space measurements. Its three main features are 1) it does not require any formal calibration procedure (calibration-free); 2) it is position-insensitive; and 3) it extracts ripple-free epsilon(r) due to gating process. The objective function derived to determine epsilon(r) by the proposed method is validated by free-space measurements of three dielectric samples (polypropylene, polyethylene, and polyoxymethylene). Besides, the accuracy of our method is compared with the accuracy of other calibrationfree and calibration-dependent methods in the literature.