Metasurface Based Reflection Type Linear Polarization Conversion for X Band Applications


Öztürk G.

Avrupa Bilim ve Teknoloji Dergisi, cilt.34, ss.773-777, 2022 (Hakemli Dergi)

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 34
  • Basım Tarihi: 2022
  • Doi Numarası: 10.31590/ejosat.1086520
  • Dergi Adı: Avrupa Bilim ve Teknoloji Dergisi
  • Derginin Tarandığı İndeksler: TR DİZİN (ULAKBİM)
  • Sayfa Sayıları: ss.773-777
  • Atatürk Üniversitesi Adresli: Evet

Özet

Polarization conversion describe the propagation behavior of the electric field component of the electromagnetic wave. Polarization converters are widely used to improve the performance of microwave devices. In recent years, polarization converters have been produced on a metasurface basis, as they have relatively great advantages over polarization converters produced by conventional methods. In this study, a metasurface-based reflection type polarization converter operating in the microwave X band is proposed. The proposed design has a linear polarization conversion rate (PCR) of over 90% in the 9.1 GHz-12 GHz frequency range. In addition, the proposed design provides linear polarization conversion performance over 80% up to 45 degrees under oblique angle. The design consists of metal termination, easily accessible FR4 and metasurface. In order to better understand the physical mechanism of the proposed metasurface-based polarization transducer, its analysis in the u-v axes was performed as well as the surface current behaviors at resonance frequencies. Since the proposed design shows the same behavior in both TE and TM modes under normal incidence, the converter behaves polarization independent. The Design CST was created in the Microwave Studio program and the simulation results were processed by the Matlab program. The results were compared with other X band polarization converters and it was seen that the proposed design is superior to existing metasurface polarization converters in oblique angle performance, single design, cost-effective and thickness.