Hasar, U. C. Et Al. 2015. Determination of Reference-Plane Invariant, Thickness-Independent, and Broadband Constitutive Parameters of Thin Materials. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES , vol.63, no.7 , 2313-2321.

Hasar, U. C., Kaya, Y., BARROSO, J. J., & ERTUĞRUL, M., (2015). Determination of Reference-Plane Invariant, Thickness-Independent, and Broadband Constitutive Parameters of Thin Materials. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES , vol.63, no.7, 2313-2321.

Hasar, Ugur Et Al. "Determination of Reference-Plane Invariant, Thickness-Independent, and Broadband Constitutive Parameters of Thin Materials," IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES , vol.63, no.7, 2313-2321, 2015

Hasar, Ugur C. Et Al. "Determination of Reference-Plane Invariant, Thickness-Independent, and Broadband Constitutive Parameters of Thin Materials." IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES , vol.63, no.7, pp.2313-2321, 2015

Hasar, U. C. Et Al. (2015) . "Determination of Reference-Plane Invariant, Thickness-Independent, and Broadband Constitutive Parameters of Thin Materials." IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES , vol.63, no.7, pp.2313-2321.

@article{article, author={Ugur C. Hasar Et Al. }, title={Determination of Reference-Plane Invariant, Thickness-Independent, and Broadband Constitutive Parameters of Thin Materials}, journal={IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES}, year=2015, pages={2313-2321} }