SAĞLAM, M. 2016. F. E. CİMİLLİ ÇATIR, M. SAĞLAM and A. TÜRÜT, The Effect Of Annealing On The Electrical Characterization Of Cu/n Type InP Schottky Diodes I-V Measurements As A Function Of Sample Tempertature. International Physics Conference At The Anatolian Peak (IPCAP 2016) , (Erzurum, Turkey), 98.

SAĞLAM, M., (2016). F. E. CİMİLLİ ÇATIR, M. SAĞLAM and A. TÜRÜT, The Effect Of Annealing On The Electrical Characterization Of Cu/n Type InP Schottky Diodes I-V Measurements As A Function Of Sample Tempertature . International Physics Conference At The Anatolian Peak (IPCAP 2016) (pp.98). Erzurum, Turkey

SAĞLAM, Mustafa. "F. E. CİMİLLİ ÇATIR, M. SAĞLAM and A. TÜRÜT, The Effect Of Annealing On The Electrical Characterization Of Cu/n Type InP Schottky Diodes I-V Measurements As A Function Of Sample Tempertature," International Physics Conference At The Anatolian Peak (IPCAP 2016), Erzurum, Turkey, 2016

SAĞLAM, Mustafa. "F. E. CİMİLLİ ÇATIR, M. SAĞLAM and A. TÜRÜT, The Effect Of Annealing On The Electrical Characterization Of Cu/n Type InP Schottky Diodes I-V Measurements As A Function Of Sample Tempertature." International Physics Conference At The Anatolian Peak (IPCAP 2016) , Erzurum, Turkey, pp.98, 2016

SAĞLAM, M. (2016) . "F. E. CİMİLLİ ÇATIR, M. SAĞLAM and A. TÜRÜT, The Effect Of Annealing On The Electrical Characterization Of Cu/n Type InP Schottky Diodes I-V Measurements As A Function Of Sample Tempertature." International Physics Conference At The Anatolian Peak (IPCAP 2016) , Erzurum, Turkey, p.98.

@conferencepaper{conferencepaper, author={Mustafa SAĞLAM}, title={F. E. CİMİLLİ ÇATIR, M. SAĞLAM and A. TÜRÜT, The Effect Of Annealing On The Electrical Characterization Of Cu/n Type InP Schottky Diodes I-V Measurements As A Function Of Sample Tempertature}, congress name={International Physics Conference At The Anatolian Peak (IPCAP 2016)}, city={Erzurum}, country={Turkey}, year={2016}, pages={98} }