BAKKALOĞLU, Ö. F. Et Al. 2022. Analysis and Comparison of the Main Electrical Characteristics of Cu/n-type Si metal semiconductor structures at wide temperature Range. SILICON , vol.14, no.7 , 3493-3500.

BAKKALOĞLU, Ö. F., EJDERHA, K., EFEOĞLU, H., KARATAŞ, Ş., & TÜRÜT, A., (2022). Analysis and Comparison of the Main Electrical Characteristics of Cu/n-type Si metal semiconductor structures at wide temperature Range. SILICON , vol.14, no.7, 3493-3500.

BAKKALOĞLU, ÖMER Et Al. "Analysis and Comparison of the Main Electrical Characteristics of Cu/n-type Si metal semiconductor structures at wide temperature Range," SILICON , vol.14, no.7, 3493-3500, 2022

BAKKALOĞLU, ÖMER F. Et Al. "Analysis and Comparison of the Main Electrical Characteristics of Cu/n-type Si metal semiconductor structures at wide temperature Range." SILICON , vol.14, no.7, pp.3493-3500, 2022

BAKKALOĞLU, Ö. F. Et Al. (2022) . "Analysis and Comparison of the Main Electrical Characteristics of Cu/n-type Si metal semiconductor structures at wide temperature Range." SILICON , vol.14, no.7, pp.3493-3500.

@article{article, author={ÖMER FARUK BAKKALOĞLU Et Al. }, title={Analysis and Comparison of the Main Electrical Characteristics of Cu/n-type Si metal semiconductor structures at wide temperature Range}, journal={SILICON}, year=2022, pages={3493-3500} }