F. E. CİMİLLİ ÇATIR Et Al. , "The Effects of Sample Temperature and Thermal Annealing on Characteristic Parameters of Au n InP In Schottky Diodes Determined From Capacitance Voltage Measurements," International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY. , 2016
CİMİLLİ ÇATIR, F. E. Et Al. 2016. The Effects of Sample Temperature and Thermal Annealing on Characteristic Parameters of Au n InP In Schottky Diodes Determined From Capacitance Voltage Measurements. International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY. .
CİMİLLİ ÇATIR, F. E., SAĞLAM, M., & Türüt, A., (2016). The Effects of Sample Temperature and Thermal Annealing on Characteristic Parameters of Au n InP In Schottky Diodes Determined From Capacitance Voltage Measurements . International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY.
CİMİLLİ ÇATIR, FULYA, Mustafa SAĞLAM, And Abdülmecit Türüt. "The Effects of Sample Temperature and Thermal Annealing on Characteristic Parameters of Au n InP In Schottky Diodes Determined From Capacitance Voltage Measurements," International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY., 2016
CİMİLLİ ÇATIR, FULYA E. Et Al. "The Effects of Sample Temperature and Thermal Annealing on Characteristic Parameters of Au n InP In Schottky Diodes Determined From Capacitance Voltage Measurements." International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY. , 2016
CİMİLLİ ÇATIR, F. E. SAĞLAM, M. And Türüt, A. (2016) . "The Effects of Sample Temperature and Thermal Annealing on Characteristic Parameters of Au n InP In Schottky Diodes Determined From Capacitance Voltage Measurements." International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY. .
@conferencepaper{conferencepaper, author={FULYA ESRA CİMİLLİ ÇATIR Et Al. }, title={The Effects of Sample Temperature and Thermal Annealing on Characteristic Parameters of Au n InP In Schottky Diodes Determined From Capacitance Voltage Measurements}, congress name={International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY.}, city={}, country={}, year={2016}}