M. ŞATA Et Al. , "Investigation of Surface Topography of GaTe and GaTe:CdSemiconductors using Atomic Force Microscopy," the International Conference onPhysical Chemistry and Functional Materials(PCFM’18)EditorsNiyazi Bulut, PhDPublished, June , 2018
ŞATA, M. Et Al. 2018. Investigation of Surface Topography of GaTe and GaTe:CdSemiconductors using Atomic Force Microscopy. the International Conference onPhysical Chemistry and Functional Materials(PCFM’18)EditorsNiyazi Bulut, PhDPublished, June .
ŞATA, M., karataş, s., ERZENEOĞLU, S. Z., TURGUT, G., & GÜRBULAK, B., (2018). Investigation of Surface Topography of GaTe and GaTe:CdSemiconductors using Atomic Force Microscopy . the International Conference onPhysical Chemistry and Functional Materials(PCFM’18)EditorsNiyazi Bulut, PhDPublished, June
ŞATA, MEHMET Et Al. "Investigation of Surface Topography of GaTe and GaTe:CdSemiconductors using Atomic Force Microscopy," the International Conference onPhysical Chemistry and Functional Materials(PCFM’18)EditorsNiyazi Bulut, PhDPublished, June, 2018
ŞATA, MEHMET Et Al. "Investigation of Surface Topography of GaTe and GaTe:CdSemiconductors using Atomic Force Microscopy." the International Conference onPhysical Chemistry and Functional Materials(PCFM’18)EditorsNiyazi Bulut, PhDPublished, June , 2018
ŞATA, M. Et Al. (2018) . "Investigation of Surface Topography of GaTe and GaTe:CdSemiconductors using Atomic Force Microscopy." the International Conference onPhysical Chemistry and Functional Materials(PCFM’18)EditorsNiyazi Bulut, PhDPublished, June .
@conferencepaper{conferencepaper, author={MEHMET ŞATA Et Al. }, title={Investigation of Surface Topography of GaTe and GaTe:CdSemiconductors using Atomic Force Microscopy}, congress name={the International Conference onPhysical Chemistry and Functional Materials(PCFM’18)EditorsNiyazi Bulut, PhDPublished, June}, city={}, country={}, year={2018}}