Saglam, M. Et Al. 2008. Calculation from the current-voltage and capacitance-voltage measurements of characteristics parameters of Cd/CdS/n-Si/Au-Sb structure with CdS interface layer grown on n-Si substrate by SILAR method. MICROELECTRONIC ENGINEERING , vol.85, no.8 , 1831-1835.

Saglam, M., Ates, A., Guezeldir, B., Yildirim, M. A., & Astam, A., (2008). Calculation from the current-voltage and capacitance-voltage measurements of characteristics parameters of Cd/CdS/n-Si/Au-Sb structure with CdS interface layer grown on n-Si substrate by SILAR method. MICROELECTRONIC ENGINEERING , vol.85, no.8, 1831-1835.

Saglam, M. Et Al. "Calculation from the current-voltage and capacitance-voltage measurements of characteristics parameters of Cd/CdS/n-Si/Au-Sb structure with CdS interface layer grown on n-Si substrate by SILAR method," MICROELECTRONIC ENGINEERING , vol.85, no.8, 1831-1835, 2008

Saglam, M. Et Al. "Calculation from the current-voltage and capacitance-voltage measurements of characteristics parameters of Cd/CdS/n-Si/Au-Sb structure with CdS interface layer grown on n-Si substrate by SILAR method." MICROELECTRONIC ENGINEERING , vol.85, no.8, pp.1831-1835, 2008

Saglam, M. Et Al. (2008) . "Calculation from the current-voltage and capacitance-voltage measurements of characteristics parameters of Cd/CdS/n-Si/Au-Sb structure with CdS interface layer grown on n-Si substrate by SILAR method." MICROELECTRONIC ENGINEERING , vol.85, no.8, pp.1831-1835.

@article{article, author={M. Saglam Et Al. }, title={Calculation from the current-voltage and capacitance-voltage measurements of characteristics parameters of Cd/CdS/n-Si/Au-Sb structure with CdS interface layer grown on n-Si substrate by SILAR method}, journal={MICROELECTRONIC ENGINEERING}, year=2008, pages={1831-1835} }