CİMİLLİ ÇATIR, F. E. Et Al. 2016. The effect of annealing on the electrical characterization of Cu n type InP Schottky diodes I V measurements as a function of sample tempertature. International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY. .

CİMİLLİ ÇATIR, F. E., SAĞLAM, M., & Abdülmecit, T., (2016). The effect of annealing on the electrical characterization of Cu n type InP Schottky diodes I V measurements as a function of sample tempertature . International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY.

CİMİLLİ ÇATIR, FULYA, Mustafa SAĞLAM, And Türüt Abdülmecit. "The effect of annealing on the electrical characterization of Cu n type InP Schottky diodes I V measurements as a function of sample tempertature," International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY., 2016

CİMİLLİ ÇATIR, FULYA E. Et Al. "The effect of annealing on the electrical characterization of Cu n type InP Schottky diodes I V measurements as a function of sample tempertature." International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY. , 2016

CİMİLLİ ÇATIR, F. E. SAĞLAM, M. And Abdülmecit, T. (2016) . "The effect of annealing on the electrical characterization of Cu n type InP Schottky diodes I V measurements as a function of sample tempertature." International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY. .

@conferencepaper{conferencepaper, author={FULYA ESRA CİMİLLİ ÇATIR Et Al. }, title={The effect of annealing on the electrical characterization of Cu n type InP Schottky diodes I V measurements as a function of sample tempertature}, congress name={International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY.}, city={}, country={}, year={2016}}