DENİZ, A. R. Et Al. 2015. Electrical Characterization of Au Fe3O4 p Si Al Rectifier Devices Depending on X Ray Radiation Dos. International Semiconductor Science and Technology Conference 2015. .

DENİZ, A. R., ÇALDIRAN, Z., ŞAHİN, Y., HATİCE, K., ŞİNOFOROĞLU, M., & AYDOĞAN, Ş., (2015). Electrical Characterization of Au Fe3O4 p Si Al Rectifier Devices Depending on X Ray Radiation Dos . International Semiconductor Science and Technology Conference 2015.

DENİZ, ALİ Et Al. "Electrical Characterization of Au Fe3O4 p Si Al Rectifier Devices Depending on X Ray Radiation Dos," International Semiconductor Science and Technology Conference 2015., 2015

DENİZ, ALİ R. Et Al. "Electrical Characterization of Au Fe3O4 p Si Al Rectifier Devices Depending on X Ray Radiation Dos." International Semiconductor Science and Technology Conference 2015. , 2015

DENİZ, A. R. Et Al. (2015) . "Electrical Characterization of Au Fe3O4 p Si Al Rectifier Devices Depending on X Ray Radiation Dos." International Semiconductor Science and Technology Conference 2015. .

@conferencepaper{conferencepaper, author={ALİ RIZA DENİZ Et Al. }, title={Electrical Characterization of Au Fe3O4 p Si Al Rectifier Devices Depending on X Ray Radiation Dos}, congress name={International Semiconductor Science and Technology Conference 2015.}, city={}, country={}, year={2015}}