EFEOĞLU, H. 2018. Memristiv effect on W/Ti/p-Si structure: Aging phenomena and one of the origin of barrier inhomogeneity. 2nd International Congress on Semiconductor Materials and Devices (ICSMD) , (Ardahan, Turkey), 7033-7039.

EFEOĞLU, H., (2018). Memristiv effect on W/Ti/p-Si structure: Aging phenomena and one of the origin of barrier inhomogeneity . 2nd International Congress on Semiconductor Materials and Devices (ICSMD) (pp.7033-7039). Ardahan, Turkey

EFEOĞLU, Hasan. "Memristiv effect on W/Ti/p-Si structure: Aging phenomena and one of the origin of barrier inhomogeneity," 2nd International Congress on Semiconductor Materials and Devices (ICSMD), Ardahan, Turkey, 2018

EFEOĞLU, Hasan. "Memristiv effect on W/Ti/p-Si structure: Aging phenomena and one of the origin of barrier inhomogeneity." 2nd International Congress on Semiconductor Materials and Devices (ICSMD) , Ardahan, Turkey, pp.7033-7039, 2018

EFEOĞLU, H. (2018) . "Memristiv effect on W/Ti/p-Si structure: Aging phenomena and one of the origin of barrier inhomogeneity." 2nd International Congress on Semiconductor Materials and Devices (ICSMD) , Ardahan, Turkey, pp.7033-7039.

@conferencepaper{conferencepaper, author={Hasan EFEOĞLU}, title={Memristiv effect on W/Ti/p-Si structure: Aging phenomena and one of the origin of barrier inhomogeneity}, congress name={2nd International Congress on Semiconductor Materials and Devices (ICSMD)}, city={Ardahan}, country={Turkey}, year={2018}, pages={7033-7039} }