E. ŞENARSLAN And M. SAĞLAM, "Voltage-frequency dependence of the complex dielectric and electric modulus and the determination of the interface-state density distribution from the capacitance-frequency measurements of Al/p-Si/Al and Al/V2O5/p-Si/Al structures," APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING , vol.130, no.9, 2024
ŞENARSLAN, E. And SAĞLAM, M. 2024. Voltage-frequency dependence of the complex dielectric and electric modulus and the determination of the interface-state density distribution from the capacitance-frequency measurements of Al/p-Si/Al and Al/V2O5/p-Si/Al structures. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING , vol.130, no.9 .
ŞENARSLAN, E., & SAĞLAM, M., (2024). Voltage-frequency dependence of the complex dielectric and electric modulus and the determination of the interface-state density distribution from the capacitance-frequency measurements of Al/p-Si/Al and Al/V2O5/p-Si/Al structures. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING , vol.130, no.9.
ŞENARSLAN, Elvan, And Mustafa SAĞLAM. "Voltage-frequency dependence of the complex dielectric and electric modulus and the determination of the interface-state density distribution from the capacitance-frequency measurements of Al/p-Si/Al and Al/V2O5/p-Si/Al structures," APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING , vol.130, no.9, 2024
ŞENARSLAN, Elvan And SAĞLAM, Mustafa. "Voltage-frequency dependence of the complex dielectric and electric modulus and the determination of the interface-state density distribution from the capacitance-frequency measurements of Al/p-Si/Al and Al/V2O5/p-Si/Al structures." APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING , vol.130, no.9, 2024
ŞENARSLAN, E. And SAĞLAM, M. (2024) . "Voltage-frequency dependence of the complex dielectric and electric modulus and the determination of the interface-state density distribution from the capacitance-frequency measurements of Al/p-Si/Al and Al/V2O5/p-Si/Al structures." APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING , vol.130, no.9.
@article{article, author={Elvan ŞENARSLAN And author={Mustafa SAĞLAM}, title={Voltage-frequency dependence of the complex dielectric and electric modulus and the determination of the interface-state density distribution from the capacitance-frequency measurements of Al/p-Si/Al and Al/V2O5/p-Si/Al structures}, journal={APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING}, year=2024}