CİMİLLİ ÇATIR, F. E. Et Al. 2016. The Effect Of Annealing On The Electrical Characterization Of Cu n Type InP Schottky Diodes C V Measurements As A Function Of Sample Tempertature. International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY. .

CİMİLLİ ÇATIR, F. E., SAĞLAM, M., & Abdülmecit, T., (2016). The Effect Of Annealing On The Electrical Characterization Of Cu n Type InP Schottky Diodes C V Measurements As A Function Of Sample Tempertature . International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY.

CİMİLLİ ÇATIR, FULYA, Mustafa SAĞLAM, And Türüt Abdülmecit. "The Effect Of Annealing On The Electrical Characterization Of Cu n Type InP Schottky Diodes C V Measurements As A Function Of Sample Tempertature," International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY., 2016

CİMİLLİ ÇATIR, FULYA E. Et Al. "The Effect Of Annealing On The Electrical Characterization Of Cu n Type InP Schottky Diodes C V Measurements As A Function Of Sample Tempertature." International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY. , 2016

CİMİLLİ ÇATIR, F. E. SAĞLAM, M. And Abdülmecit, T. (2016) . "The Effect Of Annealing On The Electrical Characterization Of Cu n Type InP Schottky Diodes C V Measurements As A Function Of Sample Tempertature." International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY. .

@conferencepaper{conferencepaper, author={FULYA ESRA CİMİLLİ ÇATIR Et Al. }, title={The Effect Of Annealing On The Electrical Characterization Of Cu n Type InP Schottky Diodes C V Measurements As A Function Of Sample Tempertature}, congress name={International Physics Conference At The Anatolian Peak (IPCAP 2016), 25-27 February 2016, Erzurum, TURKEY.}, city={}, country={}, year={2016}}