EFEOĞLU, İ. Et Al. 1999. In-Situ X-ray diffraction studies of the structure of nitride thin films under various temperatures. ICMCTF99, Int. Conf. on Metallurgical Coatings and Thin Films9 , (San Diago, United States Of America), 1.

EFEOĞLU, İ., ÇELİK, A., & Arnell, D., (1999). In-Situ X-ray diffraction studies of the structure of nitride thin films under various temperatures . ICMCTF99, Int. Conf. on Metallurgical Coatings and Thin Films9 (pp.1). San Diago, United States Of America

EFEOĞLU, İhsan, Ayhan ÇELİK, And Derek Arnell. "In-Situ X-ray diffraction studies of the structure of nitride thin films under various temperatures," ICMCTF99, Int. Conf. on Metallurgical Coatings and Thin Films9, San Diago, United States Of America, 1999

EFEOĞLU, İhsan Et Al. "In-Situ X-ray diffraction studies of the structure of nitride thin films under various temperatures." ICMCTF99, Int. Conf. on Metallurgical Coatings and Thin Films9 , San Diago, United States Of America, pp.1, 1999

EFEOĞLU, İ. ÇELİK, A. And Arnell, D. (1999) . "In-Situ X-ray diffraction studies of the structure of nitride thin films under various temperatures." ICMCTF99, Int. Conf. on Metallurgical Coatings and Thin Films9 , San Diago, United States Of America, p.1.

@conferencepaper{conferencepaper, author={İhsan EFEOĞLU Et Al. }, title={In-Situ X-ray diffraction studies of the structure of nitride thin films under various temperatures}, congress name={ICMCTF99, Int. Conf. on Metallurgical Coatings and Thin Films9}, city={San Diago}, country={United States Of America}, year={1999}, pages={1} }