AYDOĞAN, Ş. Et Al. 2011. The effects of 12 MeV electron irradiation on the electrical characteristics of the Au/Aniline blue/p-Si/Al device. MICROELECTRONICS RELIABILITY , vol.51, no.12 , 2216-2222.

AYDOĞAN, Ş., İNCEKARA, Ü., & Turut, A., (2011). The effects of 12 MeV electron irradiation on the electrical characteristics of the Au/Aniline blue/p-Si/Al device. MICROELECTRONICS RELIABILITY , vol.51, no.12, 2216-2222.

AYDOĞAN, Şakir, Ümit İNCEKARA, And Abdulmecit TÜRÜT. "The effects of 12 MeV electron irradiation on the electrical characteristics of the Au/Aniline blue/p-Si/Al device," MICROELECTRONICS RELIABILITY , vol.51, no.12, 2216-2222, 2011

AYDOĞAN, Şakir Et Al. "The effects of 12 MeV electron irradiation on the electrical characteristics of the Au/Aniline blue/p-Si/Al device." MICROELECTRONICS RELIABILITY , vol.51, no.12, pp.2216-2222, 2011

AYDOĞAN, Ş. İNCEKARA, Ü. And Turut, A. (2011) . "The effects of 12 MeV electron irradiation on the electrical characteristics of the Au/Aniline blue/p-Si/Al device." MICROELECTRONICS RELIABILITY , vol.51, no.12, pp.2216-2222.

@article{article, author={Şakir AYDOĞAN Et Al. }, title={The effects of 12 MeV electron irradiation on the electrical characteristics of the Au/Aniline blue/p-Si/Al device}, journal={MICROELECTRONICS RELIABILITY}, year=2011, pages={2216-2222} }