TURGUT, E. Et Al. 2019. Determination of the Structural Properties of NiCr2O4 and Ti Dopped NiCr2O4 Thin Films Grown byRadio Frequency Sputtering Technique (RF) and Gas Sensor Application. 3rd International Conference on AdvancedEngineering Technologies , (Bayburt, Turkey), 1226-1229.

TURGUT, E., SARITAŞ, S., YILDIRIM, M., & GÜR, E., (2019). Determination of the Structural Properties of NiCr2O4 and Ti Dopped NiCr2O4 Thin Films Grown byRadio Frequency Sputtering Technique (RF) and Gas Sensor Application . 3rd International Conference on AdvancedEngineering Technologies (pp.1226-1229). Bayburt, Turkey

TURGUT, Erdal Et Al. "Determination of the Structural Properties of NiCr2O4 and Ti Dopped NiCr2O4 Thin Films Grown byRadio Frequency Sputtering Technique (RF) and Gas Sensor Application," 3rd International Conference on AdvancedEngineering Technologies, Bayburt, Turkey, 2019

TURGUT, Erdal Et Al. "Determination of the Structural Properties of NiCr2O4 and Ti Dopped NiCr2O4 Thin Films Grown byRadio Frequency Sputtering Technique (RF) and Gas Sensor Application." 3rd International Conference on AdvancedEngineering Technologies , Bayburt, Turkey, pp.1226-1229, 2019

TURGUT, E. Et Al. (2019) . "Determination of the Structural Properties of NiCr2O4 and Ti Dopped NiCr2O4 Thin Films Grown byRadio Frequency Sputtering Technique (RF) and Gas Sensor Application." 3rd International Conference on AdvancedEngineering Technologies , Bayburt, Turkey, pp.1226-1229.

@conferencepaper{conferencepaper, author={Erdal TURGUT Et Al. }, title={Determination of the Structural Properties of NiCr2O4 and Ti Dopped NiCr2O4 Thin Films Grown byRadio Frequency Sputtering Technique (RF) and Gas Sensor Application}, congress name={3rd International Conference on AdvancedEngineering Technologies}, city={Bayburt}, country={Turkey}, year={2019}, pages={1226-1229} }