DAL, D. Et Al. 2006. Power islands: A high-level technique for counteracting leakage in Deep Sub-Micron. 7th International Symposium on Quality Electronic Design , (San-Jose, Costa Rica), 165-166.

DAL, D., Nunez, A., & Mansouri, N., (2006). Power islands: A high-level technique for counteracting leakage in Deep Sub-Micron . 7th International Symposium on Quality Electronic Design (pp.165-166). San-Jose, Costa Rica

DAL, Deniz, Adrian Nunez, And Nazanin Mansouri. "Power islands: A high-level technique for counteracting leakage in Deep Sub-Micron," 7th International Symposium on Quality Electronic Design, San-Jose, Costa Rica, 2006

DAL, Deniz Et Al. "Power islands: A high-level technique for counteracting leakage in Deep Sub-Micron." 7th International Symposium on Quality Electronic Design , San-Jose, Costa Rica, pp.165-166, 2006

DAL, D. Nunez, A. And Mansouri, N. (2006) . "Power islands: A high-level technique for counteracting leakage in Deep Sub-Micron." 7th International Symposium on Quality Electronic Design , San-Jose, Costa Rica, pp.165-166.

@conferencepaper{conferencepaper, author={Deniz DAL Et Al. }, title={Power islands: A high-level technique for counteracting leakage in Deep Sub-Micron}, congress name={7th International Symposium on Quality Electronic Design}, city={San-Jose}, country={Costa Rica}, year={2006}, pages={165-166} }