Gokalan, A. Et Al. 2020. Library Characterization of Arithmetic Circuits for Reliability-Aware Designs in SRAM-Based FPGAs. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS , vol.36, no.6 , 743-756.

Gokalan, A., TOSUN, S., & DAL, D., (2020). Library Characterization of Arithmetic Circuits for Reliability-Aware Designs in SRAM-Based FPGAs. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS , vol.36, no.6, 743-756.

Gokalan, Akin, SÜLEYMAN TOSUN, And Deniz DAL. "Library Characterization of Arithmetic Circuits for Reliability-Aware Designs in SRAM-Based FPGAs," JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS , vol.36, no.6, 743-756, 2020

Gokalan, Akin Et Al. "Library Characterization of Arithmetic Circuits for Reliability-Aware Designs in SRAM-Based FPGAs." JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS , vol.36, no.6, pp.743-756, 2020

Gokalan, A. TOSUN, S. And DAL, D. (2020) . "Library Characterization of Arithmetic Circuits for Reliability-Aware Designs in SRAM-Based FPGAs." JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS , vol.36, no.6, pp.743-756.

@article{article, author={Akin Gokalan Et Al. }, title={Library Characterization of Arithmetic Circuits for Reliability-Aware Designs in SRAM-Based FPGAs}, journal={JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS}, year=2020, pages={743-756} }