M. SAĞLAM, "F. E. CİMİLLİ ÇATIR, M. SAĞLAM and A. TÜRÜT, The Effects Of Sample Temperature And Thermal Annealing On Characteristic Parameters Of Au/n-InP/In Schottky Diodes Determined From Current-Voltage Measurements," International Physics Conference At The Anatolian Peak (IPCAP 2016) , Erzurum, Turkey, pp.452, 2016
SAĞLAM, M. 2016. F. E. CİMİLLİ ÇATIR, M. SAĞLAM and A. TÜRÜT, The Effects Of Sample Temperature And Thermal Annealing On Characteristic Parameters Of Au/n-InP/In Schottky Diodes Determined From Current-Voltage Measurements. International Physics Conference At The Anatolian Peak (IPCAP 2016) , (Erzurum, Turkey), 452.
SAĞLAM, M., (2016). F. E. CİMİLLİ ÇATIR, M. SAĞLAM and A. TÜRÜT, The Effects Of Sample Temperature And Thermal Annealing On Characteristic Parameters Of Au/n-InP/In Schottky Diodes Determined From Current-Voltage Measurements . International Physics Conference At The Anatolian Peak (IPCAP 2016) (pp.452). Erzurum, Turkey
SAĞLAM, Mustafa. "F. E. CİMİLLİ ÇATIR, M. SAĞLAM and A. TÜRÜT, The Effects Of Sample Temperature And Thermal Annealing On Characteristic Parameters Of Au/n-InP/In Schottky Diodes Determined From Current-Voltage Measurements," International Physics Conference At The Anatolian Peak (IPCAP 2016), Erzurum, Turkey, 2016
SAĞLAM, Mustafa. "F. E. CİMİLLİ ÇATIR, M. SAĞLAM and A. TÜRÜT, The Effects Of Sample Temperature And Thermal Annealing On Characteristic Parameters Of Au/n-InP/In Schottky Diodes Determined From Current-Voltage Measurements." International Physics Conference At The Anatolian Peak (IPCAP 2016) , Erzurum, Turkey, pp.452, 2016
SAĞLAM, M. (2016) . "F. E. CİMİLLİ ÇATIR, M. SAĞLAM and A. TÜRÜT, The Effects Of Sample Temperature And Thermal Annealing On Characteristic Parameters Of Au/n-InP/In Schottky Diodes Determined From Current-Voltage Measurements." International Physics Conference At The Anatolian Peak (IPCAP 2016) , Erzurum, Turkey, p.452.
@conferencepaper{conferencepaper, author={Mustafa SAĞLAM}, title={F. E. CİMİLLİ ÇATIR, M. SAĞLAM and A. TÜRÜT, The Effects Of Sample Temperature And Thermal Annealing On Characteristic Parameters Of Au/n-InP/In Schottky Diodes Determined From Current-Voltage Measurements}, congress name={International Physics Conference At The Anatolian Peak (IPCAP 2016)}, city={Erzurum}, country={Turkey}, year={2016}, pages={452} }