O. Bayram Et Al. , "Synthesis and characterization of Zn-doped Mn3O4 thin films using successive ionic layer adsorption and reaction technique: Its structural, optical and wettability properties," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.29, no.11, pp.9466-9473, 2018
Bayram, O. Et Al. 2018. Synthesis and characterization of Zn-doped Mn3O4 thin films using successive ionic layer adsorption and reaction technique: Its structural, optical and wettability properties. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.29, no.11 , 9466-9473.
Bayram, O., Ertargin, M. E., Igman, E., Guney, H., & Simsek, O., (2018). Synthesis and characterization of Zn-doped Mn3O4 thin films using successive ionic layer adsorption and reaction technique: Its structural, optical and wettability properties. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.29, no.11, 9466-9473.
Bayram, Ozkan Et Al. "Synthesis and characterization of Zn-doped Mn3O4 thin films using successive ionic layer adsorption and reaction technique: Its structural, optical and wettability properties," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.29, no.11, 9466-9473, 2018
Bayram, Ozkan Et Al. "Synthesis and characterization of Zn-doped Mn3O4 thin films using successive ionic layer adsorption and reaction technique: Its structural, optical and wettability properties." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.29, no.11, pp.9466-9473, 2018
Bayram, O. Et Al. (2018) . "Synthesis and characterization of Zn-doped Mn3O4 thin films using successive ionic layer adsorption and reaction technique: Its structural, optical and wettability properties." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.29, no.11, pp.9466-9473.
@article{article, author={Ozkan Bayram Et Al. }, title={Synthesis and characterization of Zn-doped Mn3O4 thin films using successive ionic layer adsorption and reaction technique: Its structural, optical and wettability properties}, journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS}, year=2018, pages={9466-9473} }