Rammah, Y. Et Al. 2020. Charged particles and gamma-ray shielding features of oxyfluoride semiconducting glasses: TeO2-Ta2O5-ZnO/ZnF2. Ceramics International , vol.46, no.16 , 25035-25042.

Rammah, Y., KAVAZ, E., Perişanoğlu, U., Kilic, G., El-Agawany, F., & Tekin, H., (2020). Charged particles and gamma-ray shielding features of oxyfluoride semiconducting glasses: TeO2-Ta2O5-ZnO/ZnF2. Ceramics International , vol.46, no.16, 25035-25042.

Rammah, Y.S. Et Al. "Charged particles and gamma-ray shielding features of oxyfluoride semiconducting glasses: TeO2-Ta2O5-ZnO/ZnF2," Ceramics International , vol.46, no.16, 25035-25042, 2020

Rammah, Y.S. Et Al. "Charged particles and gamma-ray shielding features of oxyfluoride semiconducting glasses: TeO2-Ta2O5-ZnO/ZnF2." Ceramics International , vol.46, no.16, pp.25035-25042, 2020

Rammah, Y. Et Al. (2020) . "Charged particles and gamma-ray shielding features of oxyfluoride semiconducting glasses: TeO2-Ta2O5-ZnO/ZnF2." Ceramics International , vol.46, no.16, pp.25035-25042.

@article{article, author={Y.S. Rammah Et Al. }, title={Charged particles and gamma-ray shielding features of oxyfluoride semiconducting glasses: TeO2-Ta2O5-ZnO/ZnF2}, journal={Ceramics International}, year=2020, pages={25035-25042} }