EFEOĞLU, H. And Turut, A. 2022. Current-voltage-measurement temperature characteristics depending on the barrier-forming contact metal thickness in Au/Cu/n-Si/Au-Sb/Ni rectifying contacts. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.143 .

EFEOĞLU, H., & Turut, A., (2022). Current-voltage-measurement temperature characteristics depending on the barrier-forming contact metal thickness in Au/Cu/n-Si/Au-Sb/Ni rectifying contacts. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.143.

EFEOĞLU, Hasan, And Abdulmecit Turut. "Current-voltage-measurement temperature characteristics depending on the barrier-forming contact metal thickness in Au/Cu/n-Si/Au-Sb/Ni rectifying contacts," MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.143, 2022

EFEOĞLU, Hasan And Turut, Abdulmecit. "Current-voltage-measurement temperature characteristics depending on the barrier-forming contact metal thickness in Au/Cu/n-Si/Au-Sb/Ni rectifying contacts." MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.143, 2022

EFEOĞLU, H. And Turut, A. (2022) . "Current-voltage-measurement temperature characteristics depending on the barrier-forming contact metal thickness in Au/Cu/n-Si/Au-Sb/Ni rectifying contacts." MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.143.

@article{article, author={Hasan EFEOĞLU And author={Abdulmecit Turut}, title={Current-voltage-measurement temperature characteristics depending on the barrier-forming contact metal thickness in Au/Cu/n-Si/Au-Sb/Ni rectifying contacts}, journal={MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING}, year=2022}