Guzeldir, B. Et Al. 2011. Laterally inhomogeneous barrier analysis of identically prepared Cd/CdS/n-Si/Au-Sb structures by SILAR method. MICROELECTRONICS RELIABILITY , vol.51, no.12 , 2179-2184.

Guzeldir, B., Saglam, M., & Ates, A., (2011). Laterally inhomogeneous barrier analysis of identically prepared Cd/CdS/n-Si/Au-Sb structures by SILAR method. MICROELECTRONICS RELIABILITY , vol.51, no.12, 2179-2184.

Guzeldir, Betül, M. Saglam, And Azman ATEŞ. "Laterally inhomogeneous barrier analysis of identically prepared Cd/CdS/n-Si/Au-Sb structures by SILAR method," MICROELECTRONICS RELIABILITY , vol.51, no.12, 2179-2184, 2011

Guzeldir, Betül Et Al. "Laterally inhomogeneous barrier analysis of identically prepared Cd/CdS/n-Si/Au-Sb structures by SILAR method." MICROELECTRONICS RELIABILITY , vol.51, no.12, pp.2179-2184, 2011

Guzeldir, B. Saglam, M. And Ates, A. (2011) . "Laterally inhomogeneous barrier analysis of identically prepared Cd/CdS/n-Si/Au-Sb structures by SILAR method." MICROELECTRONICS RELIABILITY , vol.51, no.12, pp.2179-2184.

@article{article, author={Betül GÜZELDİR Et Al. }, title={Laterally inhomogeneous barrier analysis of identically prepared Cd/CdS/n-Si/Au-Sb structures by SILAR method}, journal={MICROELECTRONICS RELIABILITY}, year=2011, pages={2179-2184} }