Taşer, A. Et Al. 2017. The stability of electrical characteristics of Ti/n-Si/Ag, Ti/n-Si/Cu and Ti/nSi/AgCu diodes prepared under the same conditions with respect to increasing aging time. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.68 , 186-192.

Taşer, A., GÜZELDİR, B., & SAĞLAM, M., (2017). The stability of electrical characteristics of Ti/n-Si/Ag, Ti/n-Si/Cu and Ti/nSi/AgCu diodes prepared under the same conditions with respect to increasing aging time. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.68, 186-192.

Taşer, Ahmet, Betül GÜZELDİR, And Mustafa SAĞLAM. "The stability of electrical characteristics of Ti/n-Si/Ag, Ti/n-Si/Cu and Ti/nSi/AgCu diodes prepared under the same conditions with respect to increasing aging time," MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.68, 186-192, 2017

Taşer, Ahmet Et Al. "The stability of electrical characteristics of Ti/n-Si/Ag, Ti/n-Si/Cu and Ti/nSi/AgCu diodes prepared under the same conditions with respect to increasing aging time." MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.68, pp.186-192, 2017

Taşer, A. GÜZELDİR, B. And SAĞLAM, M. (2017) . "The stability of electrical characteristics of Ti/n-Si/Ag, Ti/n-Si/Cu and Ti/nSi/AgCu diodes prepared under the same conditions with respect to increasing aging time." MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.68, pp.186-192.

@article{article, author={Ahmet Taşer Et Al. }, title={The stability of electrical characteristics of Ti/n-Si/Ag, Ti/n-Si/Cu and Ti/nSi/AgCu diodes prepared under the same conditions with respect to increasing aging time}, journal={MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING}, year=2017, pages={186-192} }