DETERMINATION OF THE STRUCTURAL PROPERTIES OF NiCr2O4 AND Ti DOPPED NiCr2O4 THIN FILMS GROWN BY RADIO FREQUENCY SPUTTERİNG TECHNIQUE (RF) AND GAS SENSOR APPLICATION | AVESİS

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DETERMINATION OF THE STRUCTURAL PROPERTIES OF NiCr2O4 AND Ti DOPPED NiCr2O4 THIN FILMS GROWN BY RADIO FREQUENCY SPUTTERİNG TECHNIQUE (RF) AND GAS SENSOR APPLICATION

TURGUT E. , GÜR E. , YILDIRIM M. , SARITAŞ S.

3rd International Conference on Advanced Engineering Technologies, Bayburt, Turkey, 19 - 21 September 2019, pp.186-192

Publication Type: Conference Paper / Full Text
City: Bayburt
Country: Turkey
Page Numbers: pp.186-192