Determination of effective atomic numbers in some compounds for photoelectric process at 59.54 keV by using different methods

KURUDİREK M., ÖZDEMİR Y.

JOURNAL OF X-RAY SCIENCE AND TECHNOLOGY, vol.18, no.2, pp.183-191, 2010 (SCI-Expanded) identifier identifier identifier identifier

  • Publication Type: Article / Article
  • Volume: 18 Issue: 2
  • Publication Date: 2010
  • Doi Number: 10.3233/xst-2010-0253
  • Journal Name: JOURNAL OF X-RAY SCIENCE AND TECHNOLOGY
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.183-191
  • Ataturk University Affiliated: Yes

Abstract

The total photoelectric cross sections, sigma(pe), of some compounds have been determined from the measured total attenuation cross sections by subtracting the scattering contributions at 59.54 keV. The values of sigma(pe) were then used to compute effective atomic numbers, Z(e f f) for photoelectric process at 59.54 keV. Different methods such as a direct method, an interpolation procedure and an empirical relation were employed to calculate effective atomic numbers for different compounds wherever possible. Merits and demerits of the used methods were also discussed. The obtained values of sigma(pe) and Z(e f f) from the measurements were compared with the calculated ones from theory.