Buildup factors and kerma for Al2O3 and SiO2 in the energy range 0.015-15 MeV


YILMAZ D., ALIM B., AKKUŞ T., GÜZELDİR B.

American Institute of Physics, cilt.1833, ss.20086, 2017 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 1833
  • Basım Tarihi: 2017
  • Doi Numarası: 10.1063/1.4981734
  • Dergi Adı: American Institute of Physics
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED)
  • Sayfa Sayıları: ss.20086
  • Atatürk Üniversitesi Adresli: Evet

Özet

The energy absorption buildup factors (EABF) have been calculated for some thermoluminescent dosimetric materials (Al2O3 and SiO2) in the energy region 0.015-15 MeV up to the penetration depth of 40 mean free paths (mfp). Also, kerma relative to air has been determined for these materials. It is observed that the energy absorption buildup factors and kerma relative to air depend on the photon energy and chemical content. Also, the energy absorption build up factors are found the highest in intermediate energy whereas the lowest in low-as well as high energies.