DEFECTS IN N RICH AND IN RICH InXGa1 XN In COMPOSITION DEPENDENCE


GÜR E., AKYOL F., KRISHNAMOORTHY S., RAJAN S., RİNGEL S.

The 16th conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP-XVI 2015), 6 - 10 Eylül 2015

  • Yayın Türü: Bildiri / Özet Bildiri
  • Atatürk Üniversitesi Adresli: Evet