DEFECTS IN N RICH AND IN RICH InXGa1 XN In COMPOSITION DEPENDENCE


GÜR E. , AKYOL F., KRISHNAMOORTHY S., RAJAN S., RİNGEL S.

The 16th conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP-XVI 2015), 6 - 10 September 2015

  • Publication Type: Conference Paper / Summary Text