DETERMINATION OF THE STRUCTURAL PROPERTIES OF NiO AND Al AND Zn DOPPED NiO THIN FILMS GROWN BY RADIO FREQUENCY SPUTTERİNG TECHNIQUE (RF) AND GAS SENSOR APPLICATION


TURGUT E. , sevda s., GÜR E. , YILDIRIM M. , YEŞİLYAPRAK C.

PCFM 2019 Kapadokya, 25 July - 27 September 2019, pp.45-51

  • Publication Type: Conference Paper / Full Text
  • Page Numbers: pp.45-51