ON A METHOD FOR COMPARISON OF PSEUDORANDOM NUMBER GENERATORS


SEZGIN F.

MICROELECTRONICS AND RELIABILITY, cilt.34, sa.9, ss.1557-1563, 1994 (SCI-Expanded, Scopus)

  • Yayın Türü: Makale / Kısa Makale
  • Cilt numarası: 34 Sayı: 9
  • Basım Tarihi: 1994
  • Doi Numarası: 10.1016/0026-2714(94)90467-7
  • Dergi Adı: MICROELECTRONICS AND RELIABILITY
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.1557-1563
  • Atatürk Üniversitesi Adresli: Hayır

Özet

In this study a method for comparison of pseudo-random number generators proposed recently by Brkic [1] is reexamined. The correct application of the test is indicated and rejection regions arc constructed using the distribution function of the test statistic. The results are demonstrated on various random number generators.