Investigation of K X-ray intensity ratios of some 4d transition metals depending on the temperature


Özdemir Y., Kavaz E., Ahmadı N., Ertuğrul M., Ekinci N.

Applied Radiation and Isotopes, cilt.115, ss.147-154, 2016 (SCI-Expanded) identifier identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 115
  • Basım Tarihi: 2016
  • Doi Numarası: 10.1016/j.apradiso.2016.06.017
  • Dergi Adı: Applied Radiation and Isotopes
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.147-154
  • Anahtar Kelimeler: K beta/K alpha X-ray intensity ratio, Transition element, Temperature, EXTERNAL MAGNETIC-FIELD, CR, ELEMENTS, NI, CO, TI
  • Atatürk Üniversitesi Adresli: Evet

Özet

In this paper, we have studied the intensity ratios K beta/K alpha depending on the temperature for transition elements Mo, Nb, Zr and Y by 59.5 key gamma-rays from a 100 mCi(241) Am radioisotope point source. The Ka and Kfi emission spectra of Mo, Nb, Zr and Y were measured by using a Si (Li) solid-state detector at temperature between 40 and 400 degrees C. sigma(K alpha) and sigma(K beta) production cross-sections, K beta/K alpha intensity ratios, asymmetry factor, energy shifts and full width half maximum (FWHM) values of the elements have been calculated. Temperature-dependent changes of the parameters are tabulated and given in the graphical forms. Based on the results obtained, K beta/K alpha X-ray intensity ratios of the elements are dependent on the temperature. It is shown that aicfl fluorescence cross sections of Mo, Nb and Zr have more increase rate than owa fluorescence cross sections with increasing temperature. For Y, sigma(K alpha) and sigma(K beta) production cross sections firstly decrease, then increase. In general, K beta/K alpha X-ray intensity ratios tend to increase with increasing temperature. Some significant shifts are observed in K alpha and K beta emission spectra of Mo and Y. These results may contribute to the XRF studies of transition metals. (C) 2016 Elsevier Ltd. All rights reserved.