Structural, Optical and Electrical Characterization of MBE Grown Erbium Doped GaAs, Si and SixGe1-x

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Prof. Dr. Hasan EFEOĞLU

Tez Türü: Doktora

Tezin Yürütüldüğü Kurum: University Of Manchester Institute Of Science And Technology (Umıst), Department Of Electrical Engineering And Electronics, Centre For Electronic Materials, Birleşik Krallık

Tez Danışmanı: Prof. Dr. A. R. Peaker

Tezin Onay Tarihi: 1992