Memristiv effect on W/Ti/p-Si Structure:Aging Phenımena and One of the origin of Barrier Inhomogeneity

EFEOĞLU H.

2nd INternational Congress on Semiconductor Materials and Devices, 28 - 30 Eylül 2018

  • Yayın Türü: Bildiri / Özet Bildiri
  • Atatürk Üniversitesi Adresli: Evet