The structural, optical, electrical and radiation shielding properties of Co-doped ZnO thin films

Buzok E. B., Yalcin S., Demircan G., YILMAZ D., Aktas B., Aytar E.

Radiation Physics and Chemistry, cilt.222, 2024 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 222
  • Basım Tarihi: 2024
  • Doi Numarası: 10.1016/j.radphyschem.2024.111840
  • Dergi Adı: Radiation Physics and Chemistry
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, Aerospace Database, Chemical Abstracts Core, Chimica, Communication Abstracts, Compendex, INSPEC, Metadex, Pollution Abstracts, Civil Engineering Abstracts
  • Anahtar Kelimeler: Co-doped ZnO, Cobalt complex, Electrical conductivity, Radiation shielding, Thin film
  • Atatürk Üniversitesi Adresli: Evet

Özet

Co:ZnO thin films are promising due to the similar ionic radii of cobalt and ZnO, and their potential for carrier spin injection, transfer, and detection. This study aims to investigate the structural, optical, electrical, and radiation shielding properties of Co-doped zinc oxide (Co:ZnO) thin films for potential applications in various fields such as semiconductors, solar cells, spintronics, and radiation shielding. The effect of commercially available Cobalt acetate tetrahydrate and Cobalt complex (Co with conjugated NN ligand) as cobalt additives on the synthesis of ZnO thin films is compared, aiming to discern their respective impacts. The dopants are incorporated in 2, 4, and 6 wt%, employing the sol-gel spin coating method.Applying cobalt complex additive as Co precursor resulted in ZnO:Co films with a superior enhancement of the electronic band gap of 2.84–3.00 eV compared to cobalt acetate precursor (2.62–2.84 eV). With the introduction of Cobalt, there is a notable change in the electrical conductivity, showcasing a decrease from 1.5x10−7 to 2.11x10−10 (S/cm). Also, radiation shielding parameters were experimentally measured in the energy range of 186.1–1764.5 keV within the scope of gamma ray spectral analysis. Exposure buildup factors (EBF) in the energy range of 15–15,000 keV were calculated up to 1–40 mean free path (mfp). Mass stopping power (MSP) and projected range values (PR) for nuclear safety applications were calculated for protons and alpha particles using the SRIM code. Thin film thicknesses were determined by using Lambert-Beer law. It was observed that the thin film thicknesses obtained from gamma spectrometry (2.090–2.628 μm) and SEM (2.157–2.725 μm) were compatible with each other.