K X-ray fluorescence parameters of some fourth period elements in a magnetic field

Ugurlu M., DEMİR L.

SPECTROSCOPY LETTERS, cilt.53, sa.3, ss.163-171, 2020 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 53 Sayı: 3
  • Basım Tarihi: 2020
  • Doi Numarası: 10.1080/00387010.2020.1715440
  • Dergi Adı: SPECTROSCOPY LETTERS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, Aerospace Database, Analytical Abstracts, Applied Science & Technology Source, Biotechnology Research Abstracts, Chemical Abstracts Core, Chimica, Communication Abstracts, INSPEC, Metadex, Civil Engineering Abstracts
  • Sayfa Sayıları: ss.163-171
  • Anahtar Kelimeler: Fluorescence parameters, magnetic field, radioactive source, silicon(lithium) detector, CROSS-SECTIONS, SHELL, SUBSHELL
  • Atatürk Üniversitesi Adresli: Evet

Özet

The K X-ray fluorescence (XRF) parameters, which are fluorescence cross-section, vacancy transfer probabilities and fluorescence yield, of some fourth-period elements were investigated in an external magnetic field (8000 Gauss). In order to determine the fluorescence parameters, the samples were irritated with 59.54 keV gamma rays from a 241-Americium radioactive source and the rays emitted from the samples were counted in a system consisting of a silicon - lithium drifted detector, multichannel analyzer, magnetic field implementer, and a suitable computer program. The results were studied theoretically and experimentally using the data that were obtained. It was determined that the experimental results were compatible with the theoretical results for measurements without a magnetic field and K XRF parameters changed with the magnetic field.