High efficient ultra-broadband anti-reflection coating on silicon for infrared applications


yenisoy a., yeşilyaprak c., TÜZEMEN S.

INFRARED PHYSICS & TECHNOLOGY, cilt.100, ss.82-86, 2019 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 100
  • Basım Tarihi: 2019
  • Doi Numarası: 10.1016/j.infrared.2019.05.014
  • Dergi Adı: INFRARED PHYSICS & TECHNOLOGY
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.82-86
  • Anahtar Kelimeler: Optical coating, Mid-wave infrared (MWIR), Anti-reflection, Electro-optical systems, IR imaging, THIN-FILMS, DESIGN, INDEX
  • Atatürk Üniversitesi Adresli: Evet

Özet

In this work, we describe an efficient design and fabrication process of anti-reflection (AR) coating over 1400 nm spectral interval from 3.4 mu m to 4.8 mu m at mid wave infrared (MWIR) on silicon optics with only 3 layers which have overall physical thickness less than 1 mu m. Multi-layer AR coating consisting of aluminum oxide (Al2O3) and germanium (Ge) layers as low (n(L)) and high (n(H)) index materials respectively are coated by plasma assisted e-beam evaporation on silicon substrates with well optimized process parameters. AR coating on silicon is the first one reported by exhibiting record average transmission more than 99.7% over 1400 nm broadband spectral interval in mid-wave infrared (MWIR) with minimum number of layers. Moreover, number of layers and overall thickness for our design enables a cost effective solution for low process cycle in mass production of AR coated silicon optics.