Theoretical Structural Characterization of XIn2Se4 Ternary Semiconductors Wanted to be Grow Using the Bridgman/Stockbarger Technique


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Gürbulak B.

Journal of Anatolian Physics and Astronomy, vol.3, no.1, pp.36-43, 2024 (Peer-Reviewed Journal)

Abstract

The importance of semiconductors paving the way for nano and optoelectronic

technology has recently been increasing. But, producing them easily and having their

vast application fields are most important. For that reason, the crystals have a wide

application field and their characteristics which are determined are needed. Some

researchers (Irie et al., 1979; Shih et al., 1986) have suggested that the crystals grown

should be grown in a single ampoule and a single stage, considering the idea that it

would cause selenium loss. Considering this situation, it was decided to grow XIn2Se4

crystal with this method. XIn2Se4 (X=Cu, Mn, Al, Fe) single crystals used in this

research were grown using the Bridgman/Stockbarger method. All of the samples

were freshly and gently cleaved with a razor blade from the grown ingots and no

further polishing and cleaning treatments were required because of the natural

mirror-like cleavage faces. The Samples were cleaved along the cleavage planes

(001). In this study, single crystal growth was done in a single step. The structure of

XIn2Se4 semiconductors was analysed theoretically using x-ray diffractometer (XRD),

scanning electron microscopy (SEM), energy dispersive x-ray (EDX) and Raman

spectroscopy techniques.