A Broadband and Stable Method for Unique Complex Permittivity Determination of Low-Loss Materials

HASAR U. C., Westgate C. R.

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, cilt.57, sa.2, ss.471-477, 2009 (SCI-Expanded, Scopus) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 57 Sayı: 2
  • Basım Tarihi: 2009
  • Doi Numarası: 10.1109/tmtt.2008.2011242
  • Dergi Adı: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.471-477
  • Anahtar Kelimeler: Amplitude, materials testing, microwave measurements, permittivity, INTRINSIC-PROPERTIES, PERMEABILITY, REFLECTION
  • Atatürk Üniversitesi Adresli: Evet

Özet

Transmission-reflection methods suffer from the increasing uncertainty in the phase of reflection scattering (S-) parameter measurements of Low-loss materials. In addition, transmission S-parameter measurements produce multiple solutions for the complex permittivity. In this paper, we propose a broadband and stable method for unique complex permittivity determination of low-loss materials by eliminating these problems. For elimination of the phase uncertainty problem, we utilize only the amplitudes of reflection S-parameters and complex transmission S-parameters. In order to avoid multiple solutions, we express multivalued terms, which result in multiple solutions, in terms of single-valued terms. The method can work very well in limited frequency-band applications or for dispersive materials since it is based on point-by-point (or frequency-by-frequency) extraction. We measured the complex permittivity of two low-loss dielectric materials by different methods for validation of the method.