Quantitative analysis using scattered radiation with WDXRF

Demir D.

INSTRUMENTATION SCIENCE & TECHNOLOGY, cilt.35, sa.6, ss.649-657, 2007 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 35 Sayı: 6
  • Basım Tarihi: 2007
  • Doi Numarası: 10.1080/10739140701651623
  • Dergi Adı: INSTRUMENTATION SCIENCE & TECHNOLOGY
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.649-657
  • Atatürk Üniversitesi Adresli: Hayır

Özet

The coherent and Compton scattered radiation of X-ray tube target line from the sample, instead of characteristic X-rays, has been used for the quantitative analysis in wavelength dispersive X- ray fluorescence (WDXRF) spectrometry. The relationships between the coherent to Compton intensity ratio versus the concentration and mean atomic number were determined experimentally. Also, a comparison of the scattered radiation method and fundamental parameters method, with respect to results, was made.