Measurement of angular dependencies of M X-ray differential cross sections and production cross sections using 5.96 keV photons

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Atıf İçin Kopyala

ŞAHİN M., Demir L., Kurucu Y.

JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY, cilt.261, sa.2, ss.415-419, 2004 (SCI-Expanded)

• Yayın Türü: Makale / Tam Makale
• Cilt numarası: 261 Sayı: 2
• Basım Tarihi: 2004
• Doi Numarası: 10.1023/b:jrnc.0000034879.46607.a9
• Dergi Adı: JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY
• Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
• Sayfa Sayıları: ss.415-419
• Atatürk Üniversitesi Adresli: Evet

Özet

The differential cross sections of the emission of M-shell fluorescence X-rays from Tl and Pb have been measured by 5.96 keV photons at seven angles ranging from 50degrees to 110degrees. The differential cross section is found to decrease with the increasing emission angle, showing an anisotropic spatial distribution of M-shell fluorescence X-rays. Furthermore, M-shell fluorescence cross sections and the average fluorescence yields were measured for Pt, Au, Hg, Tl, Pb, Bi, Th, and U at an excitation energy of 5.96 keV using a Si(Li) detector. The experimental results of the total M X-ray fluorescence cross sections and M-shell fluorescence yields were compared with the theoretical values.