Determination of the coating thicknesses due to the scattered radiation in energy dispersive X-ray fluorescence spectrometry

EKİNCİ N., KURUCU Y., ÖZ E., ŞAHİN Y.

Radiation Measurements, cilt.35, sa.3, ss.223-227, 2002 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 35 Sayı: 3
  • Basım Tarihi: 2002
  • Doi Numarası: 10.1016/s1350-4487(02)00048-3
  • Dergi Adı: Radiation Measurements
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.223-227
  • Anahtar Kelimeler: coating thickness, self-absorption correction, mass absorption coefficient, SAMPLE THICKNESS, MASS THICKNESS, EXCITATION, SECTIONS
  • Atatürk Üniversitesi Adresli: Evet