The investigation of the corrosion behavior of CZTS thin films prepared via electrodeposition

Demir K.

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, cilt.123, 2021 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 123
  • Basım Tarihi: 2021
  • Doi Numarası: 10.1016/j.mssp.2020.105553
  • Dergi Adı: MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, PASCAL, Applied Science & Technology Source, Chemical Abstracts Core, Chimica, Communication Abstracts, Compendex, Computer & Applied Sciences, INSPEC, Metadex
  • Anahtar Kelimeler: CZTS, XRD, EIS, Tafel, ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY, NANOCRYSTALLINE INGOT IRON, ZN-SN ELECTRODEPOSITION, SOLAR-CELL, MAGNESIUM ALLOY, WATER OXIDATION, TEMPERATURE, LAYER, TIN, SULFURIZATION
  • Atatürk Üniversitesi Adresli: Evet

Özet

In this study, Cu2ZnSnS4 (CZTS) thin films were deposited on indium tin oxide (ITO)-coated glass substrate by single-step electrochemical deposition (ECD). CZTS absorber layers were obtained with 1.05 V cathodic potential and 2700 s deposition time for pH:5 and at room temperature. Trisodium citrate was used as a complexing agent for co-electrodeposition. After the deposition, the CZTS thin films were annealed at 580 degrees C in sulfur powder and N-2 atmosphere for 60 min for the formation of stoichiometric kesterite structure. The structural, morphological and optical properties of the prepared thin films were investigated by X-ray diffraction (XRD) analysis, optical absorption techniques, scanning electron microscopy (SEM) observations and Raman spectroscopy measurements. Crystallisation of the films was confirmed by XRD measurements. The prepared films were also examined using Electrochemical Impedance Spectroscopy (EIS) and Tafel measurements. Nyquist, open circuit voltage (OCV) voltage(OCP) and Bode analysis were used to find out the structural changing and corrosion behavior of the CZTS films. The equivalent circuit parameters such as solution resistance (Rs), polarization resistance (Rp), a constant phase element (CPE), a CPE exponent (n) and diffusion potential were calculated as 253.8 Omega cm(2), 944.2 Omega cm(2), 1.547 x 10(-3) Omega(-1) s cm(-2), 0.500 and 8.631 x 10(-3) Omega(-1) s(1/2). cm(-2), respectively. Also, with the help of Tafel measurements, the corrosion potential and current values were determined as -0.161 V and 1 x 10(-6) A, respectively.