Identification of RAPD Markers Linked to Major Genes for Common Bacterial Blight Resistance Using Bulked Segregant Analysis in A Tepary Bean Cross

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PARK S. O., DURSUN A., COYNE D. P., JUNG G.

Annual Bean Reports of the Bean Improvement Cooperative, 4 - 06 Nisan 1996, cilt.39, ss.128-129, (Tam Metin Bildiri)

• Yayın Türü: Bildiri / Tam Metin Bildiri
• Cilt numarası: 39
• Sayfa Sayıları: ss.128-129
• Atatürk Üniversitesi Adresli: Evet