Identification of RAPD Markers Linked to Major Genes for Common Bacterial Blight Resistance Using Bulked Segregant Analysis in A Tepary Bean Cross

PARK S. O., DURSUN A., COYNE D. P., JUNG G.

Annual Bean Reports of the Bean Improvement Cooperative, 4 - 06 Nisan 1996, cilt.39, ss.128-129

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Cilt numarası: 39
  • Sayfa Sayıları: ss.128-129
  • Atatürk Üniversitesi Adresli: Evet