Examination of characteristic parameters of Zn/n-Si junction depending on electron radiation applied at different doses

SALARİ M. A., ŞAHİN Y., GÜZELDİR B., SAĞLAM M.

2nd International Congress on Semiconductor Materials and Devices (ICSMD-2018), 28-30 August 2018, Ardahan University, Ardahan, TURKEY, 28 - 30 Ağustos 2018

  • Yayın Türü: Bildiri / Özet Bildiri
  • Atatürk Üniversitesi Adresli: Evet