Examination of characteristic parameters of Zn/n-Si junction depending on electron radiation applied at different doses


SALARİ M. A. , ŞAHİN Y. , GÜZELDİR B. , SAĞLAM M.

2nd International Congress on Semiconductor Materials and Devices (ICSMD-2018), 28-30 August 2018, Ardahan University, Ardahan, TURKEY, 28 - 30 August 2018