Parameter Retrieval of Samples on a Substrate From Reflection-Only Waveguide Measurements
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, cilt.31, sa.3, ss.320-323, 2021 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 31 Sayı: 3
- Basım Tarihi: 2021
- Doi Numarası: 10.1109/lmwc.2020.3046697
- Dergi Adı: IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, PASCAL, Aerospace Database, Communication Abstracts, Compendex, INSPEC, Metadex, Civil Engineering Abstracts
- Sayfa Sayıları: ss.320-323
- Anahtar Kelimeler: Complex permeability, complex permittivity, known substrate, noniterative, reflection-only
- Atatürk Üniversitesi Adresli: Evet
Özet
A microwave method has been proposed for constitutive parameters' extraction of samples on a known substrate. The advantage of this method is that it relies on noniterative reflection-only (air- and metal-backed) scattering (S-) parameters so that it is a good candidate for the characterization of samples when only one-port measurements are available. It is validated by the X-band (8.2-12.4 GHz) waveguide S-parameter measurements. A sensitivity analysis is followed to evaluate and improve the performance of our method.