IEEE Microwave and Wireless Components Letters, cilt.31, ss.421-424, 2021 (SCI-Expanded)
IEEEA graphical method is extended to and applied for visual inspection of solution patterns (region of complex natural frequencies sn) in the complex s-plane for dispersive materials characterized by the Debye and Lorentz models. These patterns are in the form of exponential decay and C-shaped profiles for the Debye and Lorentz models, respectively. Their forms are observed to be affected (e.g., moving left/right) in different manners with the variation of dispersion parameters. This method, thanks to its visual inspection capability, can help in analyzing/synthesizing filters and frequency selective surfaces.