The electrical characteristics of the Fe3O4/Si junctions

Çaldıran Z., Deniz A. R., Şahin Y., Metin O., Meral K., Aydoğan Ş.

JOURNAL OF ALLOYS AND COMPOUNDS, cilt.552, ss.437-442, 2013 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 552
  • Basım Tarihi: 2013
  • Doi Numarası: 10.1016/j.jallcom.2012.11.079
  • Dergi Adı: JOURNAL OF ALLOYS AND COMPOUNDS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.437-442
  • Anahtar Kelimeler: Fe3O4, Junction, Irradiation, Current-voltage, CAPACITANCE-VOLTAGE CHARACTERISTICS, SCHOTTKY-BARRIER DIODES, MAGNETIC-PROPERTIES, CONTACTS, IRRADIATION, TRANSPORT, SI, NANOPARTICLES, TEMPERATURE, MORPHOLOGY
  • Atatürk Üniversitesi Adresli: Evet

Özet

The Fe3O4/Si junctions have been fabricated. The Fe3O4 NPs have been characterized by using TEM and XRD. Detailed study of the current-voltage (I-V) plots and capacitance-voltage measurements of the device (at f = 500 kHz) has been executed. The characteristic parameters of the structure such as ideality factor, barrier height, and series resistance have been calculated from the I-V measurements. The rectification ratio was determined to be similar to 3 x 10(4). The I-V characteristics clearly reveal the mechanism as ohmic at low voltage and that of trap-filled space charge limited current (SCLC) at higher voltage. The effect of X-ray irradiation on the junction characteristics has been studied using in situ current-voltage measurements. Diode parameters are found to vary as a function of the irradiation dose. (C) 2012 Elsevier B.V. All rights reserved.