Erzincan Üniversitesi Fen Bilimleri Enstitüsü Dergisi, cilt.14, sa.1, ss.284-291, 2021 (Hakemli Dergi)
Cr dopant effect is investigated on MgO thin films which are grown by using successive ionic layer adsorption
reaction (SILAR) technique. UV-Vis spectroscopy, XRD (X-ray diffraction), SEM (scanning electron
microscope) measurements are performed to determine how Cr doping alters morphological, structural and
optical properties of MgO nanostructures. UV-Vis spectroscopy measurements of plain MgO thin films and Cr
added MgO thin films have shown that bandgap decreased with rising Cr additive from 4.00 eV to 3.45 eV.
XRD measurements of samples have shown that all thin films were cubic structures and have planes of (200),
and (220). The surface morphologies have presented that both pure MgO nanostructures and Cr added MgO
nanostructures have nanowall formations and Cr dopant changed surface of MgO.